Technical documentation
Spec sheets, reference guides, white papers. Find all you need to learn more about our test orchestration and real-time 3D analytics solutions.
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Application notes
PMD Measurement:The EXFO Interferometric Method - English
(August 21, 2011)
Application notes
Infrared Assisted Electronic Subassembly Rework - English
(August 21, 2011)
Application notes
Laser Spectral Analysis Made Easy - English
(August 21, 2011)
Application notes
IQS-12008 All-Band Component Analyzer System: Accurate and Reliable Measurements Across the Bands - English
(August 21, 2011)
Application notes
TDM Circuit Turn-Up Made Easy with the Compact SONET/SDH Analyzer - English
(August 21, 2011)
Application notes
Commissioning VoIP over Ethernet - English
(August 21, 2011)
Application notes
Using an OSA to Measure PMD in the Field—Test Case - English
(August 21, 2011)
Application notes
Ultra-Fast Solution Applications for Prolonged Gap-Free Recordings: Controlling a Burleigh Piezo-Electric Positioner With Clampex 7 - English
(August 21, 2011)
Application notes
Cost of Ownership (COO) for Optoelectronic Manufacturing Equipment - English
(August 21, 2011)
Application notes
Pipette Drift Sources and Solutions for Patch Clamp Recording Experiments - English
(August 21, 2011)