Technical documentation
Spec sheets, reference guides, white papers. Find all you need to learn more about our test orchestration and real-time 3D analytics solutions.
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Application notes
Characterizing Polarization-Dependent Wavelength in AWGs and PLCs - English
(August 21, 2011)
Application notes
Testing with the RTU-310/G IP Services Test Heads - English
(August 21, 2011)
Application notes
New OSA 40 Gbit/s Software Function - English
(August 21, 2011)
Application notes
Locating Faults With a TDR - English
(August 21, 2011)
Application notes
Reconfigurable Optical Add/Drop Multiplexers—Testing Issues - English
(August 21, 2011)
Application notes
Detailed Ethernet Frame Analysis with EXFO’s EXpertNPA Software - English
(August 21, 2011)
Application notes
Optimizing the Selection of Your Optical Spectrum Analyzer - English
(August 21, 2011)
Application notes
Wavelength Meter Theory: Michelson Interferometry - English
(August 21, 2011)
Application notes
Wander-A Critical Parameter for Network Synchronization - English
(August 21, 2011)
Application notes
ORL Measurements in Field Applications - English
(August 21, 2011)