完整规格

FTBx-5235 - 光谱分析仪

概述
新型、紧凑的OSA, 设计用于测量通道功率和波长、鉴定Remote PHY部署与分析DWDM网
FTBx-5235 - 光谱分析仪

主要优点

  • 紧凑的入门级光谱分析仪(OSA),适用于任何类型的WDM网部署
  • 手持式OSA,配备大显示屏
  • 便携、轻巧
  • 有线运营商的理想之选
  • 直观的用户界面
  • 非常可靠的工具,由全球主要的OSA厂商打造

应用

  • 通道功率测量
  • 通道波长测量
  • DWDM网分析
  • Remote PHY部署鉴定

规格

Technical specifications
Wavelength range (nm)1250 to 1650
Wavelength uncertainty (nm) b±0.06 d; ±0.02 c, d
ReferenceInternal e
Resolution bandwidth (FWHM) f (nm)≤ 0.10 d, g
Wavelength repeatability 2σ (nm)±0.005 h
Analysis modesWDM and drift
Optical rejection ratio at 1550 nm (dB), at 0.2 nm (25 GHz)31 (35 typical)
Optical rejection ratio at 1550 nm (dB), at 0.4 nm (50 GHz)40 (45 typical)
Channel spacing33 to 200 GHz CWDM
PDL (dB) k±0.1 d
ORL (dB)>40
Measurement time (s) d, l (includes scanning, analysis and display)<1.2
Dynamic range (dBm) (per channel) b–65 d, i to 23 dB
Maximum total safe power (dBm)29
Absolute power uncertainty (dB) j±0.6
Power repeatability 2σ (dB) h±0.1
a. All specifications are for a temperature of 23 °C ± 2 °C with an FC/UPC connector unless otherwise specified, after warm-up.
b. From 1520 to 1610 nm.
c. After user calibration in the same test session within 10 nm from each calibration point.
d. Typical.
e. Integrated and wavelength-independent self-adjustment.
f. Full width at half maximum.
g. From 1300 to 1590 nm.
h. At 1550 nm, in drift mode. Single scan every 2 seconds, over 2 minutes. With DFB laser.
i. With averaging.
j. At 1550 nm, –10 dBm input power.
k. At 1550 nm, with narrow monochromatic light source.
l. 45 nm span, full resolution, 20 peaks. On FTB-1v2 DC.
General specifications
Size (H x W x D)51 mm x 159 mm x 185 mm (2 in x 6 1/4 in x 7 5/16 in)
Weight1.2 kg (2.6 lb)
Temperature, operating0 °C to 40 °C (32 °F to 104 °F)
Temperature, storage—40 °C to 50 °C (—40 °F to 122 °F)
Relative humidity< 95% non-condensing
ConnectorsEI (EXFO UPC universal interface); EA (EXFO APC universal interface)