T200M – Tunable laser for high-volume spectral characterization

Overview

Scale optical testing across production with accurate, repeatable performance, expanded wavelength coverage and streamlined integration.

Key features

Optimized for deployment with the EXFO CTP10 platform

Expanded O-band and CL-band coverage

0.1 pm wavelength resolution

Precision wavelength triggering

Automated, repeatable production testing

Standalone operation through an external PC

Passive optical components

Photonic integrated circuits

High-volume for production

Technical specifications
Product type	Benchtop