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Full specifications

CTP10 - Passive optical component testing platform

Overview
Unrivaled passive optical component testing platform for WDM components and photonic integrated circuits
CTP10 - Passive optical component testing platform

Key features

  • Optical (IL, PDL, RL) & photocurrent characterization using swept wavelength technique​
  • Industry-first full-band PDL measurement from 1260 to 1620 nm
  • Unique mix of high dynamic range, accuracy, sub-picometer resolution and test speed​
  • Integrated solution with embedded GUI and built-in analysis​
  • Scalable architecture for R&D and manufacturing environments
  • Dual operation: Optical triggering using dedicated module / Electrical triggering using logging functionality

Applications

  • Spectral characterization of integrated photonic components at sub-picometer resolution
  • Multiple-output passive optical component testing in manufacturing and R&D
  • WSS and ROADM calibration and tests
  • Thin film filters (TFF) characterization
  • Logging function for transient phenomenon
  • Spectral characterization using electrical trigger from tunable laser

Specifications

Technical specifications
Specified wavelength range - With IL PDL OPM21260 nm–1620 nm
Specified wavelength range - With IL RL OPM21250 nm–1630 nm
Operating wavelength range1240 nm–1680 nm (b)
Wavelength uncertainty (typical)±5 pm
Wavelength repeatability (typical)±1 pm (c)
Wavelength display resolution - Standard mode1 pm to 250 pm
Wavelength display resolution - High-resolution mode0.02 pm to 0.5 pm
Optical connectors - With IL PDL OPM2 - INFC/APC, PM
Optical connectors - With IL PDL OPM2 - OUTFC/APC, SMF
Optical connectors - With IL RL OPM2FC/APC, SMF
Maximum safe power - TLS IN15 dBm
Maximum safe power - SCAN SYNC14 dBm
Measurable response variation (typical)> 10 000 dB/nm at 100 nm/s (d)
Optimum tunable laser sweep speed range10 nm/s–200 nm/s
PDL measurement method - With IL PDL OPM24-States Mueller
PDL uncertainty (typical at 100 nm/s) - With IL PDL OPM2±0.06 dB + 1% PDL (e, f)
Return loss - Dynamic range (typical at 10 nm/s) - With IL RL OPM2> 55 dB
Return loss uncertainty (typical) - With IL RL OPM2±0.5 dB (g)
Insertion loss - Dynamic range (typical at 10 nm/s) - With OPMx> 80 dB (h)
Insertion loss - Dynamic range (typical at 10 nm/s) - With OPMLite> 75 dB (h)
Insertion loss - Dynamic range (typical at 100 nm/s) - With OPMx> 70 dB (h)
Insertion loss - Dynamic range (typical at 100 nm/s) - With OPMLite> 65 dB (h)
Insertion loss - Repeatability 2 σ (typical at 10 nm/s) - With OPMx - 0 dB to 20 dB±0.005 dB
Insertion loss - Repeatability 2 σ (typical at 10 nm/s) - With OPMx - 20 dB to 40 dB±0.005 dB
Insertion loss - Repeatability 2 σ (typical at 10 nm/s) - With OPMx - 40 dB to 50 dB±0.010 dB
Insertion loss - Repeatability 2 σ (typical at 10 nm/s) - With OPMx - 50 dB to 60 dB±0.030 dB
Insertion loss - Repeatability 2 σ (typical at 10 nm/s) - With OPMLite - 0 dB to 20 dB±0.005 dB
Insertion loss - Repeatability 2 σ (typical at 10 nm/s) - With OPMLite - 20 dB to 40 dB±0.005 dB
Insertion loss - Repeatability 2 σ (typical at 10 nm/s) - With OPMLite - 40 dB to 50 dB±0.020 dB
Insertion loss - Repeatability 2 σ (typical at 10 nm/s) - With OPMLite - 50 dB to 60 dB±0.075 dB
Insertion loss - Repeatability 2 σ (typical at 100 nm/s) - With OPMx - 0 dB to 20 dB±0.005 dB
Insertion loss - Repeatability 2 σ (typical at 100 nm/s) - With OPMx - 20 dB to 40 dB±0.010 dB
Insertion loss - Repeatability 2 σ (typical at 100 nm/s) - With OPMx - 40 dB to 50 dB±0.050 dB
Insertion loss - Repeatability 2 σ (typical at 100 nm/s) - With OPMx - 50 dB to 60 dB±0.250 dB
Insertion loss - Repeatability 2 σ (typical at 100 nm/s) - With OPMLite - 0 dB to 20 dB±0.005 dB
Insertion loss - Repeatability 2 σ (typical at 100 nm/s) - With OPMLite - 20 dB to 40 dB±0.020 dB
Insertion loss - Repeatability 2 σ (typical at 100 nm/s) - With OPMLite - 40 dB to 50 dB±0.150 dB
Insertion loss - Repeatability 2 σ (typical at 100 nm/s) - With OPMLite - 50 dB to 60 dB±0.300 dB
Spectral measurement with electrical trigger - Specified wavelength range1250 nm–1630 nm
Spectral measurement with electrical trigger - Dynamic range (typical at 10 nm/s) - With OPMLite> 80 dB (i)
Spectral measurement with electrical trigger - Dynamic range (typical at 100 nm/s) - With OPMLite> 70 dB (i)
Optical detectors - Sensor type - With OPMxTemperature-controlled InGaAs
Optical detectors - Sensor type - With OPMLiteUncooled InGaAs
Optical detectors - Compatible fiber typeSMF28
Optical detectors - Compatible optical adaptors - With OPMxFC or SC connectors
Optical detectors - Compatible optical adaptors - With OPMLiteFixed FC/APC connectors
Optical detectors - Maximum safe power - With OPMx11 dBm
Optical detectors - Maximum safe power - With OPMLite18 dBm
Optical detectors - Averaging timeManual: 1 µs to 1 s, automatic
Optical detectors - Display acquisition resolution< 0.0001 dB
Optical detectors - Return loss (typical) - With OPMx> 56 dB
Optical detectors - Return loss (typical) - With OPMLite> 49 dB
Optical detectors - Polarization dependent response (typical)0.05 dB
Optical detectors - Insertion loss linearity (characteristic at 10 nm/s) - With OPMx - Over 30 dB range±0.025 dB (d)
Optical detectors - Insertion loss linearity (characteristic at 10 nm/s) - With OPMx - Over 65 dB range±0.035 dB (d)
Optical detectors - Insertion loss linearity (characteristic at 10 nm/s) - With OPMLite - Over 30 dB range±0.025 dB (d)
Optical detectors - Insertion loss linearity (characteristic at 10 nm/s) - With OPMLite - Over 55 dB range±0.035 dB (d)
Optical detectors - Insertion loss linearity (characteristic at 100 nm/s) - With OPMx - Over 30 dB range±0.025 dB (d)
Optical detectors - Insertion loss linearity (characteristic at 100 nm/s) - With OPMx - Over 60 dB range±0.035 dB (d)
Optical detectors - Insertion loss linearity (characteristic at 100 nm/s) - With OPMLite - Over 30 dB range±0.025 dB (d)
Optical detectors - Insertion loss linearity (characteristic at 100 nm/s) - With OPMLite - Over 50 dB range±0.035 dB (d)
Photocurrent meters - Measurement configurationGrounded cathode, photovoltaic – no reverse bias (e)
Photocurrent meters - Photocurrent range–85 dBmA to 10 dBmA (f)
Photocurrent meters - Current uncertainty (characteristic)±1% (g)
Photocurrent meters - Linearity (characteristic)±0.05 dB ±2 pA (h)
Photocurrent meters - Noise 2 σ (typical at 10 nm/s) - 8 dBmA to –20 dBmA±0.005 dB (i)
Photocurrent meters - Noise 2 σ (typical at 10 nm/s) - –20 dBmA to –40 dBmA±0.010 dB (i)
Photocurrent meters - Noise 2 σ (typical at 10 nm/s) - –40 dBmA to –50 dBmA±0.015 dB (i)
Photocurrent meters - Noise 2 σ (typical at 10 nm/s) - –50 dBmA to –60 dBmA±0.050 dB (i)
Photocurrent meters - Noise 2 σ (typical at 100 nm/s) - 8 dBmA to –20 dBmA±0.005 dB (i)
Photocurrent meters - Noise 2 σ (typical at 100 nm/s) - –20 dBmA to –40 dBmA±0.030 dB (i)
Photocurrent meters - Noise 2 σ (typical at 100 nm/s) - –40 dBmA to –50 dBmA±0.150 dB (i)
Photocurrent meters - Noise 2 σ (typical at 100 nm/s) - –50 dBmA to –60 dBmA±0.500 dB (i)
Photocurrent meters - Maximum safe current11 dBmA
Photocurrent meters - ConnectorsTriaxial 2-lug Pomona – center contact: anode; outer contact: cathode; shield: ground (j)
(a) Unless otherwise specified, after 1-hour warm-up (for the CTP10 mainframe and modules), at a constant temperature of 23 °C ± 1 °C, SMF28 patchcord, FC/APC connector. Guaranteed specifications are given with a 99% confidence level and characteristic specifications are given with a 68% confidence level.
(b) When using SCAN SYNC, first and last 2.5 nm of the laser(s) wavelength scanning range are not usable. For O-band laser, last 5 nm are not usable.
(c) Over one minute, within optimum tunable laser sweep speed range, laser optical power 10 dBm.
(d) For IL < 45 dB, tunable laser power 10 dBm and averaging time set to 1 μs.
(e) For PDL < 2 dB and IL < 20 dB; 10 dBm TLS, auto average time, after zeroing of optical detectors, FC/PC connector to OPM. Higher PDL values can be displayed depending on measurement conditions.
(f) ±0.04 dB + 1% PDL over spectral range 1490 nm to 1620 nm.
(g) For RL < 40 dB, degree of polarization < 5%. Tunable laser power 10 dBm, after zeroing of optical detector, averaging time set to Automatic.
(h) Tunable laser power 10 dBm, after zeroing of optical detector, averaging time set to Automatic and without FBC module in optical path.
(i) Tunable laser power 13 dBm, after zeroing of optical detector and averaging time adapted to the scanning speed.
(j) Designed to be connected to EXFO's triaxial cable and photodiode. For any other connection, please check with EXFO.
General specifications
Display ports2x (HDMI + display port) / Compatible with split screen display and touchscreen with multitouch control
RemoteEthernet (Option: GPIB)
Electrical inputs (hardware ready)10x BNC
Electrical outputs (hardware ready)7x BNC including 2 analog output ports
Other inputs - Rear panel of mainframe2x USB 2.0 and 2x USB 3.0
Number of module slots - Front panel of mainframe10
Other inputs - Front panel of mainframe3x USB-A 2.0
Data storage - Hard driveHDD, 2 TB
Temperature - Storage–20 °C to 65 °C (–4 °F to 149 °F)
Temperature - Operating5 °C to 40 °C (41 °F to 104 °F)
Weight - Mainframe8.5 kg (18.7 lb)
Weight - Module1 kg to 2.8 kg (2.2 lb to 6.2 lb)
Dimensions (mainframe – H × W × D)178 mm × 482 mm × 435 mm (7 in × 19 in × 17 in) / 4U full rack with rackmount fixtures
Power supply100 V to 240 V AC (50/60 Hz)